Difference between revisions of "Detailed plan for testing production SiPM units"
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− | DRAFT | + | DRAFT SiPM Testing Plan<br> |
− | [[July 23, 2009 Calorimetry | Discussion notes of July 23]], moved to this page for | + | # [[July 23, 2009 Calorimetry | Discussion notes of July 23]], moved to this page for further refinement. |
+ | # Updated based on preparations for the collaboration meeting in September. | ||
== Testing of electronic components (Fernando) == | == Testing of electronic components (Fernando) == | ||
− | # Fernando | + | # Fernando has a schedule for developing the required on-board electronics ([[Media:SiPM_Dev_Schedule.pdf|SiPM_Dev_Schedule]]) showing that testing of the electronics could be completed by mid October. |
# Output of the preamp will be one signal per array. | # Output of the preamp will be one signal per array. | ||
Line 13: | Line 14: | ||
# When both sensors are available, measure SensL and Hamamatsu with the same illumination for comparison. | # When both sensors are available, measure SensL and Hamamatsu with the same illumination for comparison. | ||
− | == Stability tests of light sensors == | + | == Stability tests of light sensors (Carl) == |
# Keep several samples for reference | # Keep several samples for reference | ||
# Arrays under test should be powered continuously. | # Arrays under test should be powered continuously. | ||
Line 28: | Line 29: | ||
# It is desirable to test SensL units at 5 deg. C. | # It is desirable to test SensL units at 5 deg. C. | ||
# Options | # Options | ||
− | #* Place entire setup in | + | #* Place entire setup in an "ice-cold" box |
#* Install Peltier on each sensor gluing the Peltier to the "hot plate" and attaching the hot plate to the sensor package using a thermal paste. | #* Install Peltier on each sensor gluing the Peltier to the "hot plate" and attaching the hot plate to the sensor package using a thermal paste. | ||
− | # Repeat measurements performed at room temperature, but at the lower | + | # Repeat measurements performed at room temperature, but at the lower 5deg nominal operating temperature. |
# If possible measure the dark rate in this configuration. | # If possible measure the dark rate in this configuration. | ||
+ | |||
+ | == Additional Tests == | ||
+ | # Eugene: One test that should be included in the plan is to use two independent LED pulsers and check the linearity of response when they come close together in time. |
Latest revision as of 14:37, 22 October 2009
DRAFT SiPM Testing Plan
- Discussion notes of July 23, moved to this page for further refinement.
- Updated based on preparations for the collaboration meeting in September.
Contents
Testing of electronic components (Fernando)
- Fernando has a schedule for developing the required on-board electronics (SiPM_Dev_Schedule) showing that testing of the electronics could be completed by mid October.
- Output of the preamp will be one signal per array.
Single sensor tests at room temperature (Carl)
- Check that all 16 cells are operational by scanning across array. Identify any problems with individual cells within the array.
- Noise levels will be too high to measure dark rate directly -- Dark current will be measured for the array instead.
- PDE can be determined relative to single-cell 3x3 mm2 units
- Measure output with calibrated light source to determine PDE for array.
- When both sensors are available, measure SensL and Hamamatsu with the same illumination for comparison.
Stability tests of light sensors (Carl)
- Keep several samples for reference
- Arrays under test should be powered continuously.
- Output may be monitored using a picoAmmeter
- Measure response to high light levels (e.g. x20, x100 expected) and return to normalcy.
- Radiation damage tests
- Radcon Cs-137 130 mCi calibrated radioactive source available for irradiating sensors.
- Place SiPM(s) in a small portable dark box fully powered. Use LED light pulser to monitor response as sensor is irradiated.
- Temperature stability tests
- Cycle samples through temperature range and verify robustness.
- Note that the expected exposure in Hall D is 0.14 Gy/year at high intensity running.
Single sensor tests at 5 deg (nominal) (Carl)
- It is desirable to test SensL units at 5 deg. C.
- Options
- Place entire setup in an "ice-cold" box
- Install Peltier on each sensor gluing the Peltier to the "hot plate" and attaching the hot plate to the sensor package using a thermal paste.
- Repeat measurements performed at room temperature, but at the lower 5deg nominal operating temperature.
- If possible measure the dark rate in this configuration.
Additional Tests
- Eugene: One test that should be included in the plan is to use two independent LED pulsers and check the linearity of response when they come close together in time.