Difference between revisions of "Fall 2016"

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:: - Ajust trigger parameters (busy thresholds, TS trigger inhibit thresholds)
 
:: - Ajust trigger parameters (busy thresholds, TS trigger inhibit thresholds)
 
:: - Check performance of electronics modules at high rate
 
:: - Check performance of electronics modules at high rate
::: (reveal electronics problems and limiting factors: data rate, etc.)  
+
::: (reveal electronics problems and limiting factors: data transmission rate, etc.)  
 
:: - Study L1 trigger rate limitations
 
:: - Study L1 trigger rate limitations
 
* Take data for several thresholds at different luminosity (check efficiency)
 
* Take data for several thresholds at different luminosity (check efficiency)
 
 
 
 
 
* PS trigger
 
::-  PS trigger efficiency studies  (using TAGM/TAGH, FCAL & BCAL triggers)
 
::-  Threshold scans
 
 
* FCAL & BCAL main production trigger
 
::-  threshold scans for individual  FCAL and BCAL triggers (study trigger time dependence on thresholds, rates)
 
::-  collect data samples using the FCAL and BCAL individual triggers
 
::-  introduce individual thresholds for BCAL and FCAL energies for the FCAL & BCAL trigger
 
::-  tune timing offsets between BCAL and FCAL (rate scans)
 
::-  trigger rate studies. Adjust energy thresholds. Take data for different thresholds and different luminosity
 
 
*  Implement TS FP triggers
 
::- BCAL LED
 
::- FCAL LED
 
::- PS LED
 
 
* Implement multiple triggers (initial implementation)
 
::-  combine PS, FCAL & BCAL, FCAL, and BCAL triggers
 
:::    (note FCAL and BCAL triggers may be taken out from the production trigger later on).
 
::- add TS periodic pulser
 
::- add TS FP triggers
 
 
* TAC trigger
 
::-  implement TAC stand alone trigger
 
::-  implement configuration with the PS and TAC triggers. Read out TAGH/TAGM crates
 
 
 
 
 
* Implement triggers for efficiency studies (have to decide what would be the best rigger for this, besides the minimum bias)
 
 
* Implement TAGH/TAGM triggers
 
::-  combine TAGH/TAGM with other trigger types
 
 
* Trigger for FDC alignment (ST / TOF + FCAL )
 
 
*  Trigger for FCAL MIPs calibration ( ST & TOF )
 
 
* Improve BCAL & FCAL triggers at low FCAL energies (use coincidences between FCAL and ST/TOF)
 
 
 
::* PS trigger (TAGM bias voltage calibration, TAGH, PS voltage scans, efficiency studies). Run TRD in parallel, if no problems.
 
::: - test/debug trigger (2 - 3 hours).
 
::: - production (1 - 2 night shifts)
 
:::: run conditions depend on the accelerator performance (200 nA electron current, 10^-4 radiator, 10^-3 converter + Be converter, TBD) 
 
::* Trigger for FDC alignment (ST/TOF + FCAL)
 
::* Trigger for FCAL MIPs calibration (ST & TOF)
 
::: - test/debug trigger (3 - 4 hours, CDC/FDC switched off)
 
::: - production at low luminosity  with the FDC switched on (1 - 2 night shifts for both the FDC alignmnent and FCAL MIP triggers) 
 
::* Debug FCAL/BCAL trigger
 
::: - trigger studies (3 - 4 hours)
 
::: - take data with the BCAL/FCAL trigger, FCAL/BCAL thresholds will be tuned, chambers can be switched on depending on run conditions (1 - 2 night shifts).
 
::: - test trigger performance at high rate. Take data with 'nominal' trigger thresholds.
 
::* Trigger generated by TAGM/TAGH
 
::: - trigger studies (3 - 4 hours)
 
::: - combine TAGH/TAGM with other trigger types.
 
::: - take data with the total absorption counter, 2x10-5 radiator, a few nA current (TBD)  (2 - 3 hours)
 
::* Special trigger requests from sub-detectors
 

Latest revision as of 08:25, 15 September 2016

Phase III. Performance at high rate

  • Perform luminosity scan
  • Beam and detector conditions:
- Beam flux 2. - 5. x 10^7 photons/sec.
- Exclude CDC/FDC/TOF at high rate if detectors are not ready (calibrate baselines if needed)
(repeat tests when sub-detectors are ready)
  • Study L1 rate for various trigger thresholds
- Trigger types: FCAL & BCAL (& ST), TAGH & ST, (FCAL, BCAL)
- Ajust trigger parameters (busy thresholds, TS trigger inhibit thresholds)
- Check performance of electronics modules at high rate
(reveal electronics problems and limiting factors: data transmission rate, etc.)
- Study L1 trigger rate limitations
  • Take data for several thresholds at different luminosity (check efficiency)