Difference between revisions of "Detailed plan for testing production SiPM units"
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== Testing of electronic components (Fernando) == | == Testing of electronic components (Fernando) == | ||
− | # Fernando | + | # Fernando has a schedule for developing the required on-board electronic ([[Media:SiPM_Dev_Schedule.pdf|SiPM_Dev_Schedule]]) showing that testing of the electronics should be completed by mid October. |
# Output of the preamp will be one signal per array. | # Output of the preamp will be one signal per array. | ||
Revision as of 11:51, 5 October 2009
DRAFT DRAFT
Discussion notes of July 23, moved to this page for future development.
Contents
Testing of electronic components (Fernando)
- Fernando has a schedule for developing the required on-board electronic (SiPM_Dev_Schedule) showing that testing of the electronics should be completed by mid October.
- Output of the preamp will be one signal per array.
Single sensor tests at room temperature (Carl)
- Check that all 16 cells are operational by scanning across array. Identify any problems with individual cells within the array.
- Noise levels will be too high to measure dark rate directly -- Dark current will be measured for the array instead.
- PDE can be determined relative to single-cell 3x3 mm2 units
- Measure output with calibrated light source to determine PDE for array.
- When both sensors are available, measure SensL and Hamamatsu with the same illumination for comparison.
Stability tests of light sensors
- Keep several samples for reference
- Arrays under test should be powered continuously.
- Output may be monitored using a picoAmmeter
- Measure response to high light levels (e.g. x20, x100 expected) and return to normalcy.
- Radiation damage tests
- Radcon Cs-137 130 mCi calibrated radioactive source available for irradiating sensors.
- Place SiPM(s) in a small portable dark box fully powered. Use LED light pulser to monitor response as sensor is irradiated.
- Temperature stability tests
- Cycle samples through temperature range and verify robustness.
- Note that the expected exposure in Hall D is 0.14 Gy/year at high intensity running.
Single sensor tests at 5 deg (nominal) (Carl)
- It is desirable to test SensL units at 5 deg. C.
- Options
- Place entire setup in a "ice-cold" box
- Install Peltier on each sensor gluing the Peltier to the "hot plate" and attaching the hot plate to the sensor package using a thermal paste.
- Repeat measurements performed at room temperature, but at the lower nominal 5deg operating temperature
- If possible measure the dark rate in this configuration.