Difference between revisions of "Detailed plan for testing production SiPM units"

Revision as of 11:33, 5 October 2009

DRAFT DRAFT
Discussion notes of July 23, moved to this page for future development.

Testing of electronic components (Fernando)

1. Fernando showed a tentative SiPM_Dev_Schedule, showing that testing of the electronics should be completed by mid October.
2. Output of the preamp will be one signal per array.

Single sensor tests at room temperature (Carl)

1. Check that all cells are operational by scanning across array.
2. Calibrate a light source and determine a (relative) gain for each cell. Determine PDE if possible.
3. Measure dark current. (Dark rate is not possible at room temperature).

Single sensor tests at 5 deg (nominal) (Carl)

1. Install Peltier on each sensor gluing the Peltier to the "hot plate" and attaching the hot plate to the sensor package using a thermal paste.
2. Repeat measurements performed at room temperature, but at a nominal operating temperature
3. If possible measure the dark rate in this configuration.

Low irradiation

1. low radiation, guestimated to be about 0.01 Gy/month)
2. Place 6-8 arrays in a box with Sr source (Keep a few for reference)
3. Arrays should be powered continuously
4. Arrays should be operated at the nominal operating temperature (~5deg) using Peltier
5. Arrays should be exposed to temperature cycles
6. Output may be monitored using a picoAmmeter

Realistic exposures to radiation

1. Measurements in Hall B?