Detailed plan for testing production SiPM units

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Revision as of 11:51, 5 October 2009 by Elton (Talk | contribs) (Testing of electronic components (Fernando))

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DRAFT DRAFT
Discussion notes of July 23, moved to this page for future development.

Testing of electronic components (Fernando)

  1. Fernando has a schedule for developing the required on-board electronic (SiPM_Dev_Schedule) showing that testing of the electronics should be completed by mid October.
  2. Output of the preamp will be one signal per array.

Single sensor tests at room temperature (Carl)

  1. Check that all 16 cells are operational by scanning across array. Identify any problems with individual cells within the array.
  2. Noise levels will be too high to measure dark rate directly -- Dark current will be measured for the array instead.
  3. PDE can be determined relative to single-cell 3x3 mm2 units
    • Measure output with calibrated light source to determine PDE for array.
  4. When both sensors are available, measure SensL and Hamamatsu with the same illumination for comparison.

Stability tests of light sensors

  1. Keep several samples for reference
  2. Arrays under test should be powered continuously.
  3. Output may be monitored using a picoAmmeter
  4. Measure response to high light levels (e.g. x20, x100 expected) and return to normalcy.
  5. Radiation damage tests
    • Radcon Cs-137 130 mCi calibrated radioactive source available for irradiating sensors.
    • Place SiPM(s) in a small portable dark box fully powered. Use LED light pulser to monitor response as sensor is irradiated.
  6. Temperature stability tests
    • Cycle samples through temperature range and verify robustness.
  7. Note that the expected exposure in Hall D is 0.14 Gy/year at high intensity running.

Single sensor tests at 5 deg (nominal) (Carl)

  1. It is desirable to test SensL units at 5 deg. C.
  2. Options
    • Place entire setup in a "ice-cold" box
    • Install Peltier on each sensor gluing the Peltier to the "hot plate" and attaching the hot plate to the sensor package using a thermal paste.
  3. Repeat measurements performed at room temperature, but at the lower nominal 5deg operating temperature
  4. If possible measure the dark rate in this configuration.