Difference between revisions of "Fall 2016"
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| Line 9: | Line 9: | ||
:: - Ajust trigger parameters (busy thresholds, TS trigger inhibit thresholds) | :: - Ajust trigger parameters (busy thresholds, TS trigger inhibit thresholds) | ||
:: - Check performance of electronics modules at high rate | :: - Check performance of electronics modules at high rate | ||
| − | ::: (reveal electronics problems and limiting factors: data rate, etc.) | + | ::: (reveal electronics problems and limiting factors: data transmission rate, etc.) |
:: - Study L1 trigger rate limitations | :: - Study L1 trigger rate limitations | ||
* Take data for several thresholds at different luminosity (check efficiency) | * Take data for several thresholds at different luminosity (check efficiency) | ||
Latest revision as of 08:25, 15 September 2016
Phase III. Performance at high rate
- Perform luminosity scan
- Beam and detector conditions:
- - Beam flux 2. - 5. x 10^7 photons/sec.
- - Exclude CDC/FDC/TOF at high rate if detectors are not ready (calibrate baselines if needed)
- (repeat tests when sub-detectors are ready)
- Study L1 rate for various trigger thresholds
- - Trigger types: FCAL & BCAL (& ST), TAGH & ST, (FCAL, BCAL)
- - Ajust trigger parameters (busy thresholds, TS trigger inhibit thresholds)
- - Check performance of electronics modules at high rate
- (reveal electronics problems and limiting factors: data transmission rate, etc.)
- - Study L1 trigger rate limitations
- Take data for several thresholds at different luminosity (check efficiency)
