Difference between revisions of "Test Setup for SiPMs"
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* Temperature sensor: [http://www.vernier.com/go/gotemp.html Go!Temp] [http://www.vernier.com/labview/downloads/#go Driver] (USB) | * Temperature sensor: [http://www.vernier.com/go/gotemp.html Go!Temp] [http://www.vernier.com/labview/downloads/#go Driver] (USB) | ||
* Low voltage power supply: multiple output | * Low voltage power supply: multiple output | ||
| − | * Bias voltage power supply: [http://www.bkprecision.com/products/model/1787B/0-72vdc-0-15a-programmable-dc-supply-w-rs232-interface.html B&K 1787B] (RS232) | + | * Bias voltage power supply: [http://www.bkprecision.com/products/model/1787B/0-72vdc-0-15a-programmable-dc-supply-w-rs232-interface.html B&K 1787B] [http://www.bkprecision.com/products/model/1787B/0-72vdc-0-15a-programmable-dc-supply-w-rs232-interface.html Driver] (RS232) |
| − | * Pulse Generator: [http://www.testequipmentdepot.com/usedequipment/hewlettpackard/signalgenerators/8116a.htm HP 8116A] (GPIB) | + | * Pulse Generator: [http://www.testequipmentdepot.com/usedequipment/hewlettpackard/signalgenerators/8116a.htm HP 8116A] [http://sine.ni.com/apps/utf8/niid_web_display.download_page?p_id_guid=01C70A48687D33EFE0440003BA7CCD71 Driver] (GPIB) |
| − | * Picoamp Meter: [http://www.teknetelectronics.com/Search.asp?p_ID=11201&pDo=DETAIL Keithley 485] (GPIB) | + | * Picoamp Meter: [http://www.teknetelectronics.com/Search.asp?p_ID=11201&pDo=DETAIL Keithley 485] [http://sine.ni.com/apps/utf8/niid_web_display.download_page?p_id_guid=E3B19B3E90D5659CE034080020E74861 Driver] (GPIB) |
| − | * Programmable Electrometer [http://www.metrictest.com/product_info.jsp?mfgmdl=KEI%20617 Keithley 617] (GPIB) | + | * Programmable Electrometer [http://www.metrictest.com/product_info.jsp?mfgmdl=KEI%20617 Keithley 617] [http://sine.ni.com/apps/utf8/niid_web_display.download_page?p_id_guid=E3B19B3E94A2659CE034080020E74861 Driver] (GPIB) |
==== Gain ==== | ==== Gain ==== | ||
Revision as of 18:31, 1 February 2011
Contents
Test of First Article of Hamamatsu SiPMs at JLab
Time Line
- Mid Feb.2012: 10-20pcs partial shipment of first article units
- Mid Mar.2012: Delivery remainder first article units (60-70pcs)
- End Apr.2012: First article approval
- End Jul.2012: 1st delivery 500pcs
- End Aug.2012: 2nd delivery 500pcs
- End Sept.2012: 3rd delivery 120pcs
Test Items and Instruments Needed
General Devices
- Central Machine: Windows XP computer with LabVIEW 2009 installed (USB)
- VME controller: Wiener VM-USB DLL Driver (USB to VME)
- QDC: CAEN V792 Example (VME)
- Oscilloscope: Tektronix TPO4104 Driver (RS232,USB,Ethernet)
- Temperature sensor: Go!Temp Driver (USB)
- Low voltage power supply: multiple output
- Bias voltage power supply: B&K 1787B Driver (RS232)
- Pulse Generator: HP 8116A Driver (GPIB)
- Picoamp Meter: Keithley 485 Driver (GPIB)
- Programmable Electrometer Keithley 617 Driver (GPIB)
Gain
- Measure ADC spectrum w. or w./o light source
- Measure distance between peaks, calculate the corresponding charge and then gain
Photo Detection Efficiency (PDE)
- Continuous method (DC mode): overestimated due to cross-talk and after pulsing
- Measure draw current with calibrated light input
- Divide current by gain and photon flux to get "PDE"
- Pulse mode
- Measure ADC spectrum triggered by calibrated pulse light source
- Fit the spectrum by the function derived here to extract detected number of photons and cross-talk/after pulsing
- Divide the detected number of photons by input to get PDE
Cross-Talk/After Pulsing
- Cross-Talk and After Pulsing are sometimes mixed, in this context they are defined base on the timing:
- Cross-Talk means fast secondary signals which happen almost simultaneously with the primary signal which are likely due to the secondary photon generated by the primary signal leaked to adjacent pixels.
- After Pulsing means slow secondary signals which happen after the primary signal which are likely due to the delayed release of trapped electrons.
- Threshold method
- Pure measurement with dark noise
- This method is mainly sensitive to Cross-Talk.
- Set threshold of counter at 0.5, 1.5 and 2.5 photon electrons, compare the rates at different rates to extract Cross-Talk.
- Formalism to extract cross-talk is still needed to be derived, effect of pile up and after pulsing needed to be taken into account.
- ADC method
- Same method as pulse mode discussed in the PDE measurement
- Flash method
- Use Oscilloscope or Flash ADC to record the time spectrum with very weak but instantaneous light input (laser for example),
- By comparing the shape of the time spectrum from the single photon events with all events to extract the after pulsing
- Such a method was discussed in SiPM radiation test
