Test Setup for SiPMs

Test of First Article of Hamamatsu SiPMs at JLab

Time Line

1. Mid Feb.2011: 10-20pcs partial shipment of first article units
2. Mid Mar.2011: Delivery remainder first article units (60-70pcs)
3. End Apr.2011: First article approval
4. End Jul.2011: 1st delivery 500pcs
5. End Aug.2011: 2nd delivery 500pcs
6. End Sept.2011: 3rd delivery 120pcs

LabVIEW Programs and Data Directory

Directory

LabVIEW programs and acquired data are stored on sipm_pc.jlab.org in ARC building room 628.

• Directory for LabVIEW programs: C:\SiPM_Test\LabVIEW
• Directory for QDC data: C:\SiPM_Test\Data\QDC
• Directory for instrument's manuals: C:\SiPM_Test\Manuals
• Directory for instrument's drivers: C:\SiPM_Test\Drivers

LabView Programs

• DAQ_Control.vi
  • 
  • Performs multi-channel DAQ with V792 VME QDC module
  • Data saved in C:\SiPM_Test\Data\QDC and organized with directories named by the starting time
  • Each directory contains the following files:
    • Settings.txt: settings for the DAQ session
    • Raw_Data.txt: raw data file of individual events of active channels, two columns: channel number, ADC channel
    • Histo_xxx.txt: individual or stacked histograms of active channels, two columns: ADC channel (0-4095), count
    • Readings.txt: readings of voltage, current and temperature during DAQ, five columns: relative time (s), set voltage (V), output voltage (V), draw current (nA), temperature (C)

• VI_Curve.vi
  • 
  • Performs V-I curve measurement of SiPMs
  • Data saved in C:\SiPM_Test\Data\VI_Curve and organized with directories named by the starting time
  • Each directory contains the following files:
    • Settings.txt: settings for the scan
    • Data.txt: readings of voltage, current and temperature during measurement, five columns: relative time (s), set voltage (V), output voltage (V), draw current (nA), temperature (C)

Analysis Code

• replay.C
  • 
  • 

Test Results

• Web page for 1st article test results
• SiPM sample#1: [1]

• MySQL Database:
  • server: halldweb1.jlab.org
  • port: 3306 (MySQL default)
  • username: halld
  • password: ask Yi
  • Database: halld_sipm
  • Tables:
    • fist_article_spec: Specifications of first article samples - average properties
      • sn: [SMALLINT] Serial Number
      • voltage: [DECIMAL(4,2)] Average voltage (V)
      • vol_var: [DECIMAL(3,1)] Standard deviation in voltage of individual channels (mV)
      • m_var: [DECIMAL(3,1)] Variation of gain (%, from Hamamatsu spec sheet)
      • dark_rate: [DECIMAL(4,2)] Total dark rate (MHz)
      • dr_var: [DECIMAL(3,1)] Relative standard deviation in dark rate of individual channels (%)
      • remark: [CHAR[60]] Remarks
    • first_article_tile: Specifications of first article samples - individual channels
      • sn: [SMALLINT] Serial Number
      • channel: [TINYINT] Channel number (1-16)
      • voltage: [DECIMAL(4,2)] Voltage of individual channels for a 7.5×10⁵ gain (V)
      • dark_rate: [DECIMAL(3,2)] Dark rate of individual channels (MHz)
    • first_article_result: Test results of first article sample - average values
      • sn: [SMALLINT] Serial Number
      • date: [DATE] Date of measurement
      • voltage: [DECIMAL(4,2)] Voltage at 25C (V)
      • gate: [DECIMAL(4,0)] ADC Gate (ns)
      • dark_rate: [DECIMAL(3,2)] Average dark rate from individual channels(MHz)
      • dr_var: [DECIMAL(3,1)] Relative standard deviation in dark rate (%)
      • pde: [DECIMAL(3,3)] Average PDE
      • pde_var: [DECIMAL(3,1)] Relative standard deviation in PDE (%)
      • gain: [DECIMAL(3,2)] Average gain (×10⁵)
      • gain_var: [DECIMAL(3,1)] Relative standard deviation in gain (%)
      • cross_talk: [DECIMAL(3,3)] Average cross-talk and after pulsing in ADC gate
      • ct_var: [DECIMAL(3,1)] Relative standard deviation in cross-talk (%)
      • remark: [CHAR[60]] Remarks
    • first_article_result_tile: Test results of first article sample - individual channels
      • sn: [SMALLINT] Serial Number
      • channel: [TINYINT] Channel number (1-16)
      • date: [DATE] Date of measurement
      • dark_rate: [DECIMAL(3,2)] Dark rate (MHz)
      • pde: [DECIMAL(3,3)] PDE
      • gain: [DECIMAL(3,2)] Gain (×10⁵)
      • cross_talk: [DECIMAL(3,3)] Cross-talk and after pulsing in ADC gate
    • sipm_spec: Specifications of production units - average properties
      • same structure as first_article_spec
    • sipm_spec_tile: Specifications of production units - individual channels
      • same structure as first_article_spec_tile

• How to use MS Office Access to access MySQL database
  1. Install MySQL Connector/ODBC 32-bit version: link
     • install 32-bit version connector even if your Windows copy is 64-bit
  2. Open a new database or existing one in MS Office Access
  3. Link to a ODBC database:
     1. In Access tool bar, select "External Data" tab
     2. In the "Import" section, click "More" and then select "ODBC Database"
     3. In the "Get External Data - ODBC Database" window, choose "Link to the data source by creating a linked table", click "OK"
     4. In the "Select Data Source" window select "Machine Data Source" tab
     5. If you haven't created a MySQL data source, follow these steps to create one:
        1. Click "New...", acknowledge the following warning if you do not have Administrative privilege.
        2. In the "Create New Data Source" window, select the type of data source preferred, choose "User Data Source" then click "Next>"
        3. Choose "MySQL ODBC 5.x Driver" then click "Next>", then "Finish"
        4. In the "MySQL Connector/ODBC Data Source Configuration" Windows, give a new "Data Source Name", type in halldweb1.jlab.org for "TCP/IP Server", halld for "User" and corresponding password. If everything goes correctly, you should be able to select halld_sipm database in the pull-down menu. Click "OK" to finish the configuration.
     6. Select the Data Source you created for the halld_sipm database, click "OK"
     7. Select the table(s) you want to access then click "OK"
     8. You can now operate the MySQL database through Access

Test Items and Instruments Needed

General Devices

• Central Machine: SiPM_PC.jlab.org (129.57.72.17) Windows 7 computer with LabVIEW 2009 SP1 installed (USB)
• VME controller: Wiener VM-USB DLL Driver (USB to VME)
• QDC: CAEN V792 Example (VME)
• Oscilloscope: Tektronix TPO4104 Driver (RS232,USB,Ethernet)
• Temperature sensor: Go!Temp Driver (USB)
• Low voltage power supply: multiple output
• Bias voltage power supply: B&K 1787B Driver (RS232)
• Pulse Generator: HP 8116A Driver (GPIB)
• Picoamp Meter: Keithley 485 Driver (GPIB)
• Programmable Electrometer Keithley 617 Driver (GPIB)

Gain (being tested, all done)

1. Measure ADC spectrum w. or w./o light source
2. Measure distance between peaks, calculate the corresponding charge and then gain

Photo Detection Efficiency (PDE) (being tested, all done)

• Continuous method (DC mode): overestimated due to cross-talk and after pulsing

1. Measure draw current with calibrated light input
2. Divide current by gain and photon flux to get "PDE"

• Pulse mode

1. Measure ADC spectrum triggered by calibrated pulse light source
2. Fit the spectrum by the function derived here to extract detected number of photons and cross-talk/after pulsing
3. Divide the detected number of photons by input to get PDE

Cross-Talk/After Pulsing

• Cross-Talk and After Pulsing are sometimes mixed, in this context they are defined base on the timing:

1. Cross-Talk means fast secondary signals which happen almost simultaneously with the primary signal which are likely due to the secondary photon generated by the primary signal leaked to adjacent pixels.
2. After Pulsing means slow secondary signals which happen after the primary signal which are likely due to the delayed release of trapped electrons.

• Threshold method

1. Pure measurement with dark noise
2. This method is mainly sensitive to Cross-Talk.
3. Set threshold of counter at 0.5, 1.5 and 2.5 photon electrons, compare the rates at different rates to extract Cross-Talk.
4. Formalism to extract cross-talk is still needed to be derived, effect of pile up and after pulsing needed to be taken into account.

• ADC method (being tested, all done)

1. Same method as pulse mode discussed in the PDE measurement

• Flash method

1. Use Oscilloscope or Flash ADC to record the time spectrum with very weak but instantaneous light input (laser for example),
2. By comparing the shape of the time spectrum from the single photon events with all events to extract the after pulsing
3. Such a method was discussed in SiPM radiation test

Irradiation Test

• Irradiated with RadCon AmBe neutron souce
  • 2011/04/15 09:30 - 2011/04/19 09:40
  • Total dose: 43.3 rem
  • Temperature: 25 degreeC
  • Sample: #1 and #3

• 60C nealing
  • 2011/04/25 18:00 - 2011/04/27 10:00

• Some results
  • sample#1
    • Before: 1.92 uA, 0.95 MHz
    • Right after irradiation: 70 uA
    • After irradiation and some recovery: 48.4 uA, 24.4 MHz
    • After full recovery: 31.5 uA, 16.5 MHz
    • Previous samples: 16 MHz/43.2 rem

• Conclusion
  • Exactly the same radiation damage

Magnet field test

• Tested both the SiPM and its preamplifier in a magnetic field up to 0.5 Tesla, and no effect of the field was shown

Temperature Compensation Test

Instrumentation

1. NI 6218
   • 16-Bit, 250 kS/s Isolated M Series MIO DAQ
   • Manual
2. Fluke 189
   • Data Logging Multimeter
   • Manual
   • LabVIEW Driver
3. Tektronix TPO4104
   • Mixed Signal Oscilloscope
   • Manual
   • LabVIEW Driver