Difference between revisions of "Test Setup for SiPMs"
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==== General Devices ==== | ==== General Devices ==== | ||
− | * Central Machine: Windows | + | * Central Machine: SiPM_PC.jlab.org (129.57.72.17) Windows 7 computer with LabVIEW 2009 SP1 installed (USB) |
* VME controller: [http://www.wiener-d.com/products/18/70.html Wiener VM-USB] [http://wiener-us.com/forums/viewtopic.php?t=17 DLL] [http://www.wiener-us.com/forums/viewtopic.php?t=64 Driver] (USB to VME) | * VME controller: [http://www.wiener-d.com/products/18/70.html Wiener VM-USB] [http://wiener-us.com/forums/viewtopic.php?t=17 DLL] [http://www.wiener-us.com/forums/viewtopic.php?t=64 Driver] (USB to VME) | ||
* QDC: [http://www.caen.it/jsp/Template2/CaenProd.jsp?parent=11&idmod=41 CAEN V792] [http://www.wiener-us.com/forums/viewtopic.php?t=45 Example] (VME) | * QDC: [http://www.caen.it/jsp/Template2/CaenProd.jsp?parent=11&idmod=41 CAEN V792] [http://www.wiener-us.com/forums/viewtopic.php?t=45 Example] (VME) |
Revision as of 13:38, 8 February 2011
Contents
Test of First Article of Hamamatsu SiPMs at JLab
Time Line
- Mid Feb.2012: 10-20pcs partial shipment of first article units
- Mid Mar.2012: Delivery remainder first article units (60-70pcs)
- End Apr.2012: First article approval
- End Jul.2012: 1st delivery 500pcs
- End Aug.2012: 2nd delivery 500pcs
- End Sept.2012: 3rd delivery 120pcs
Test Items and Instruments Needed
General Devices
- Central Machine: SiPM_PC.jlab.org (129.57.72.17) Windows 7 computer with LabVIEW 2009 SP1 installed (USB)
- VME controller: Wiener VM-USB DLL Driver (USB to VME)
- QDC: CAEN V792 Example (VME)
- Oscilloscope: Tektronix TPO4104 Driver (RS232,USB,Ethernet)
- Temperature sensor: Go!Temp Driver (USB)
- Low voltage power supply: multiple output
- Bias voltage power supply: B&K 1787B Driver (RS232)
- Pulse Generator: HP 8116A Driver (GPIB)
- Picoamp Meter: Keithley 485 Driver (GPIB)
- Programmable Electrometer Keithley 617 Driver (GPIB)
Gain
- Measure ADC spectrum w. or w./o light source
- Measure distance between peaks, calculate the corresponding charge and then gain
Photo Detection Efficiency (PDE)
- Continuous method (DC mode): overestimated due to cross-talk and after pulsing
- Measure draw current with calibrated light input
- Divide current by gain and photon flux to get "PDE"
- Pulse mode
- Measure ADC spectrum triggered by calibrated pulse light source
- Fit the spectrum by the function derived here to extract detected number of photons and cross-talk/after pulsing
- Divide the detected number of photons by input to get PDE
Cross-Talk/After Pulsing
- Cross-Talk and After Pulsing are sometimes mixed, in this context they are defined base on the timing:
- Cross-Talk means fast secondary signals which happen almost simultaneously with the primary signal which are likely due to the secondary photon generated by the primary signal leaked to adjacent pixels.
- After Pulsing means slow secondary signals which happen after the primary signal which are likely due to the delayed release of trapped electrons.
- Threshold method
- Pure measurement with dark noise
- This method is mainly sensitive to Cross-Talk.
- Set threshold of counter at 0.5, 1.5 and 2.5 photon electrons, compare the rates at different rates to extract Cross-Talk.
- Formalism to extract cross-talk is still needed to be derived, effect of pile up and after pulsing needed to be taken into account.
- ADC method
- Same method as pulse mode discussed in the PDE measurement
- Flash method
- Use Oscilloscope or Flash ADC to record the time spectrum with very weak but instantaneous light input (laser for example),
- By comparing the shape of the time spectrum from the single photon events with all events to extract the after pulsing
- Such a method was discussed in SiPM radiation test