Difference between revisions of "For the third coil"
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'''To-do list''' | '''To-do list''' | ||
+ | |||
* Wiring | * Wiring | ||
** checkout, understand noise, signal clipping and interaction between modules | ** checkout, understand noise, signal clipping and interaction between modules | ||
+ | ** eliminiate pickup on downstream lead/splice (esp. during dump) | ||
+ | ** understand induced voltages on taps during testing | ||
* Danfysik power supply | * Danfysik power supply | ||
+ | ** fix broken transistor | ||
+ | ** commission fault sequencer | ||
** understand ramp-down mechanism | ** understand ramp-down mechanism | ||
+ | ** understand varying fast dump time constants | ||
** fix slow dump | ** fix slow dump | ||
** choose ground fault detection compatible with quench detector | ** choose ground fault detection compatible with quench detector | ||
Line 12: | Line 18: | ||
* Danfysik quench detector | * Danfysik quench detector | ||
+ | ** implement front-end balancing circuits | ||
− | * | + | * Instrumentation |
− | + | ** ensure all devices on clean power | |
− | + | ** check out Newport controllers, flow switch | |
− | * | + | ** implement system to isolate fault detectors and determine time sequence of trips |
− | ** | + | ** understand spikes on shunt Newport |
+ | ** understand effect of B field on all sensors | ||
+ | ** monitor circuit breakers? | ||
+ | * NI USB device | ||
+ | ** rework Zener/divider box, needs to be fully bipolar | ||
+ | ** eliminate noise | ||
* A-B HMI improvements | * A-B HMI improvements | ||
** upgrade to 100 screen license | ** upgrade to 100 screen license | ||
+ | ** implement fault sequence screens | ||
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* EPICS | * EPICS | ||
− | |||
* EWEB screens | * EWEB screens | ||
** update for latest tags and drawings | ** update for latest tags and drawings | ||
− | |||
Revision as of 10:58, 10 March 2011
To-do list
- Wiring
- checkout, understand noise, signal clipping and interaction between modules
- eliminiate pickup on downstream lead/splice (esp. during dump)
- understand induced voltages on taps during testing
- Danfysik power supply
- fix broken transistor
- commission fault sequencer
- understand ramp-down mechanism
- understand varying fast dump time constants
- fix slow dump
- choose ground fault detection compatible with quench detector
- Danfysik quench detector
- implement front-end balancing circuits
- Instrumentation
- ensure all devices on clean power
- check out Newport controllers, flow switch
- implement system to isolate fault detectors and determine time sequence of trips
- understand spikes on shunt Newport
- understand effect of B field on all sensors
- monitor circuit breakers?
- NI USB device
- rework Zener/divider box, needs to be fully bipolar
- eliminate noise
- A-B HMI improvements
- upgrade to 100 screen license
- implement fault sequence screens
- A-B PLC program improvements
- use custom ("add-on") instructions to simplify code
- EPICS
- EWEB screens
- update for latest tags and drawings
For the hall
- note that max ramp rate in the hall is approximately 10V / 20H = 0.5 A/sec
- should we install a UPS on the Danfysik contactor and control boards?
- do we need additional valves, check valves, bypasses, whatever?
- do we need Dataforth voltage attenuators on coil tap channels?
- do we need active isolation of coil tap channels, etc?
- should we monitor all circuit breakers?
- should we monitor all relays?
- effect of B field on sensors/relays?