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GlueX Experiment Document 1028-v1

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Integrated Tests of a High Speed VXS Switch Card and 250 MSPS Flash ADC

Document #:
GlueX-doc-1028-v1
Document type:
Poster
Submitted by:
R. Chris Cuevas
Updated by:
R. Chris Cuevas
Document Created:
21 Apr 2008, 08:38
Contents Revised:
21 Apr 2008, 08:38
Metadata Revised:
21 Apr 2008, 08:38
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Abstract:
High trigger rate experiments proposed for the 12 GeV upgrade at the Thomas Jefferson National Accelerator Facility create a need for new high speed digital systems for energy summing. Signals from particle physics detectors will be captured with the Jefferson Lab (FADC) module, which collects and processes data from 16 charged particle sensors with 10 or 12 bit resolution at 250MHz sample rate.
Both FADC and Energy Sum modules have been designed and assembled and this paper describes the integrated tests using both high speed modules in unison.
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